Open-loop for waveform acquisition

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United States of America Patent

PATENT NO 6853941
APP PUB NO 20030016153A1
SERIAL NO

10136710

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Abstract

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Methods and apparatus, including computer program products, implementing and using techniques for open-loop waveform acquisition. In general, in one aspect, the invention provides a method for open-loop waveform acquisition. The method includes acquiring an S-curve of an acquisition loop of an electron-beam probe system. The S-curve represents a response of the acquisition loop to changes of potential differences between the acquisition loop and a device under test. The method includes calibrating the acquisition loop to obtain a linear region in the acquired S-curve and using the linear portion of the acquired S-curve to calculate voltage at a probe point of the device under test.

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Patent Owner(s)

Patent OwnerAddress
DCG SYSTEMS INC45900 NORTHPORT LOOP EAST FREMONT CA 94538

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kanai, Kenichi Palo Alto, CA 46 694
Koike, Hiroyasu Tokyo, JP 3 12
Wang, Hui Newark, CA 1115 8921

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