Optical analysis systems
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United States of America Patent
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Feb 8, 2005
Grant Date -
N/A
app pub date -
Jan 15, 2004
filing date -
Jan 15, 2004
priority date (Note) -
Expired
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Abstract
A system for optical detection of kinetic samples. The system includes a dual set of detectors linked to a single processor. The time of signal integration is different for each detector, allowing one detector to have a higher sensitivity by integrating over a longer time period while the second detector using shorter integration periods is able to measure kinetic events.
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