Method and device for near-field measuring of non-controlled radiation
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United States of America Patent
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Feb 1, 2005
Grant Date -
N/A
app pub date -
May 6, 2002
filing date -
Aug 3, 1999
priority date (Note) -
Expired
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Abstract
An electric field emitted by an electronic equipment is measured by producing at least one radiation measurement in the radiating field of the equipment. Several sets of simultaneous near-field measurements, within a measuring surface located at a short distance from the equipment, are performed. The sets of performed measurements are processed by estimating the statistical properties of the radiated field at any point outside the measuring surface.
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