Method and apparatus for measuring inductance
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United States of America Patent
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Jan 4, 2005
Grant Date -
Feb 14, 2002
app pub date -
Sep 4, 2001
filing date -
Mar 22, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for measuring changes induced in an inductive field on a wire-loop of an oscillator circuit based upon variations in a current function without the need to measure frequency changes. Induced noise has independent effects upon the current function and voltage function of an inductance measurement circuit. By inductively coupling one input and directly coupling the second input of a comparator circuit to the inductance measurement circuit, the phase of the current function can be adjusted to coincide with the phase of the voltage function. By combining the voltage function with the current function, an output isolating the induced noise from the measured inductance is obtained.
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