Method and device for the exposure-dependent noise correction in image sensors which can be addressed in lines and columns
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United States of America Patent
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Dec 14, 2004
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N/A
app pub date -
Mar 30, 2001
filing date -
Sep 30, 1998
priority date (Note) -
Expired
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Abstract
Method and device for the exposure-dependent noise correction in images sensor which can be addressed in lines and columns are converted into digital values and an offset voltage correction is carried out by a summer, a gain correction is carried out by a multiplier, and an exposure-dependent dark current correction is carried out by a further summer. Further, the coefficients that depend on the line number, the column number and the integration time, are determined by linear approximations. As a result, the fixed pattern noise (PFN) in CMOS image sensor can be efficiently suppressed with a relatively low outlay.
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