Automated semiconductor probing device
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Nov 30, 2004
Grant Date -
N/A
app pub date -
Jun 20, 2001
filing date -
Jun 20, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Apparatus and methods are provided for automated semiconductor device probing. The apparatus includes a probe assembly; a machine vision system; and a semiconductor support fixture. A method includes providing apparatus for automated semiconductor device probing; locating the semiconductor device positioned on the semiconductor support fixture with the machine vision system; guiding the movement of at least one of the probe assembly and the semiconductor support fixture so as to position a contact portion of the semiconductor device and the electrical probe in alignment with one another; and moving at least one of the probe assembly and the semiconductor support fixture toward the other of the at least one of the probe assembly and the semiconductor support fixture so as to position the electrical probe and the contact portion of the semiconductor device in electrical connection with one another.
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