Method and system for increasing yield in embedded memory devices
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United States of America Patent
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Nov 16, 2004
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N/A
app pub date -
Apr 4, 2000
filing date -
Apr 4, 2000
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Abstract
Aspects for increasing yield in an embedded memory device are described. With the aspects of the present invention, a cache is provided for a memory unit of an embedded memory device. Attempts to access a failed bit memory location in the memory unit are determined. When a failed memory bit location is being accessed, substitution of a memory location in the cache for the failed bit memory location occurs.
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