Notched electrical test probe tip
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 26, 2004
Grant Date -
Oct 9, 2003
app pub date -
Feb 10, 2003
filing date -
Jul 31, 2000
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects preferably is a probing tip with a longitudinal planar axis and two planar contact surfaces. The contact surfaces substantially form an inverted 'V' from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully