X-ray phase contrast imaging using a fabry-perot interferometer concept
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United States of America Patent
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Oct 12, 2004
Grant Date -
Oct 17, 2002
app pub date -
Mar 1, 2001
filing date -
Mar 1, 2001
priority date (Note) -
Expired
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Abstract
An analyzer that includes a first multilayer structure, a spacer material deposited on the first multilayer structure and a second multilayer structure deposited on the spacer material.
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