Testing of BGA and other CSP packages using probing techniques
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United States of America Patent
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Sep 14, 2004
Issued Date -
N/A
app pub date -
May 8, 2002
filing date -
Feb 18, 1999
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Abstract
A method and apparatus for handling small semiconductor devices in the testing of these devices. Multiple devices are mounted within a device strip carrier and are positioned in the testing position. This positioning of the device strip carriers is performed using device strip carrier alignment tools; the device strip carrier can readily be repositioned with respect to the test head/probe card for testing of multiple devices contained within the device strip carrier.
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