Apparatus for method for immersion lithography

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United States of America Patent

PATENT NO 6788477
APP PUB NO 20040075895A1
SERIAL NO

10278962

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus for immersion lithography that includes an imaging lens which has a front surface, a wafer that has a top surface to be exposed positioned spaced-apart and juxtaposed to the front surface of the imaging lens, and a fluid that has a refractive index between about 1.0 and about 2.0 filling a gap formed in-between the front surface of the imaging lens and the top surface of the wafer. A method for immersion lithography can be carried out by flowing a fluid through a gap formed in-between the front surface of an imaging lens and a top surface of a wafer. The flow rate and temperature of the fluid can be controlled while particulate contaminants are filtered out by a filtering device.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTDTAIWAN HSINCHU CHINA HSINCHU CITY TAIWAN PROVINCE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lin, Burn Jeng Hsin chu, TW 127 3214

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