Combinational test pattern generation method and apparatus
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United States of America Patent
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Aug 24, 2004
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N/A
app pub date -
Oct 1, 2002
filing date -
Mar 10, 1999
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Expired
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Abstract
A method and apparatus that couple a change input scan chain test pattern with an initialization scan chain test pattern such that a resultant scan chain test pattern is produced, and apply the resultant scan chain test pattern to at least one combinational logic path. In one embodiment, the coupling is achieved by interleaving the change input scan chain test pattern with the initialization scan chain test pattern. In another embodiment, the coupling is achieved by creating a constructed test pattern set from the change input and the initialization scan chain test pattern.
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