Method and apparatus for extracting three-dimensional spacial data of object using electron microscope
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United States of America Patent
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Aug 3, 2004
Grant Date -
Feb 12, 2004
app pub date -
Jun 17, 2003
filing date -
Aug 9, 2002
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Abstract
A method and apparatus for extracting three-dimensional data of an object using an electron microscope are provided. The method for extracting the three-dimensional data of the object includes: obtaining two-dimensional coordinates by respectively projecting the object on a plane perpendicular to an X-axis, on a plane perpendicular to a Y-axis, and on a plane making an angle of 45 degrees from a Z-axis with a Y-Z plane; in portions where three images including the two-dimensional coordinates overlapped, obtaining data of a pixel on a base images among the three images, obtaining data of corresponding pixels of the pixel on the base image to left and right images of the base image, and calculating a disparity on the basis of the data; and extracting three-dimensional depth information of the object using the obtained disparity, the three-dimensional depth information representing a relative distance of the object, and extracting a three-dimensional coordinate on each pixel to determine a three-dimensional location of the object.
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