System and method for monitoring process quality control

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United States of America Patent

PATENT NO 6766283
SERIAL NO

09689884

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Abstract

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A method of modeling a monitorable stage in a process is provided. The method including the steps of: (a) measuring at least one input value of a parameter of the monitorable stage of the process; (a) measuring at least one output value of the parameter of the monitorable stage of the process; and (c) utilizing the at least one input value and the at least one output value for constructing a process output empirical model for uncovering a functional relationship between the at least one input value and at least one output value, the step of constructing the process output empirical modeler being effected by: (i) dividing at least one interval of the parameter into a plurality of sub intervals, such that each of the at least one interval is divided into at least two of the sub intervals; (ii) classifying the at least one output value according to the plurality of sub intervals, thereby presenting the at least one output value as a plurality of discrete variables defining the at least one output value; and (iii) using the plurality of discrete variables defining the at least one output value for defining the functional relationship between the at least one input value and the at least one output value, thereby modeling the monitorable stage of the process.

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Patent Owner(s)

Patent OwnerAddress
ADA ANALYTICS ISRAEL LTD19 HARTUM STREET JERUSALEM 9214501

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fisher, Joseph Jerusalem, IL 81 2329
Goldman, Arnold J Jerusalem, IL 34 1632
Hartman, Jehuda Rehovot, IL 15 570
Sarel, Shlomo Ma'aleh Michmash, IL 7 410

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