Measurement of optical properties of passive optical devices using the matrix method
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United States of America Patent
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Jul 13, 2004
Grant Date -
Aug 28, 2003
app pub date -
Feb 27, 2003
filing date -
Feb 27, 2002
priority date (Note) -
Expired
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Abstract
A property of a device that is dependent upon both wavelength and state of polarization is measured by; passing through the device an optical signal having its wavelength and SOP varied, the wavelength over a spectral range of the device and the SOP between four Mueller SOPs; measuring the insertion loss of the device for each of the four SOPS and at each wavelength; using the four insertion loss measurements for each of the four different states of polarization for each wavelength to compute the four elements of the first line of the Mueller matrix for each wavelength; and using the Mueller matrix elements, computing insertion loss variations for the device for a multiplicity of input states of polarization in addition to the four states of polarization for which the actual attenuation measurements were made and using the insertion loss variations to compute the polarization and wavelength dependent property.
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