Instrument for measuring and sorting resistors and method therefor
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United States of America Patent
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Jun 15, 2004
Grant Date -
N/A
app pub date -
May 1, 2000
filing date -
Jul 22, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention describes a method for measuring and classifying resistors (2), in which in a measuring station (3) the resistance value of the resistor (2) supplied by a feed and transport device (12) of the measuring station (3) is measured. The measured resistance value is transmitted to an evaluation unit (40) of a control device (20). The resistor (2) is delivered sorted according to predetermined measurement ranges into an output device (25) arranged after the measuring station (3). The resistor (2) is heated to a predefined nominal temperature by a temperature regulating device (7), in particular by a medium (9). After reaching this nominal temperature the resistor (2) is contacted in the medium (9). Afterwards the measurement of the resistor (2) is carried out.
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