Interference filter transmission wavelength scanning photometer

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United States of America Patent

PATENT NO 6747276
APP PUB NO 20020190211A1
SERIAL NO

09959454

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An interference filter transmission wavelength scanning photometer operable to determine the concentration of an interesting component in a sample without interference from coexisting components by measuring the light absorption of the interesting component. An angle of inclination of an interference filter varies periodically and is centered at the maximum absorption wavelength of the interesting component. The wavelength of a transmitted light is modulated due to the periodical variation of the angle of inclination. Variation in the intensity of the light transmitted through a sample is extracted by an infrared sensor as an electric signal. The time between rise and fall zero cross points of an AC component of the electric signal is determined by a microprocessor. A ratio is calculated from a full period and a half period of the AC component. The concentration of the interesting component is determined from a variation in the calculation of the ratio.

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Patent Owner(s)

Patent OwnerAddress
NIKKISO CO LTDTOKYO JAPAN TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Watanabe, Atsuo 602, Asahigaoka Heights, 2-24, Asahigaoka 3-chome, Hino-shi, Tokyo, JP 191-0065 98 1828

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