Apparatus and method for measuring quality measure of phase noise waveform
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United States of America Patent
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May 11, 2004
Grant Date -
N/A
app pub date -
Mar 29, 2000
filing date -
Mar 29, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A clock signal x.sub.c (t) that has been converted into a digital signal is transformed into a complex analytic signal z.sub.c (t), and an instantaneous phase .THETA. of the z.sub.c (t) is estimated. A linear phase is removed from the .THETA. to obtain a phase noise waveform .DELTA..phi.(t). The .DELTA..phi.(t) is sampled at a timing close to a zero crossing timing of the x.sub.c (t) to extract the .DELTA..phi.(t) sample. A root-mean-square value .sigma..sub.t of the .DELTA..phi.(t) samples is obtained, and a differential waveform of the extracted .DELTA..phi.(t) samples is also obtained to obtain a period jitter J.sub.p. Then a root-mean-square value .sigma..sub.p of the J.sub.p is obtained to calculate a correlation coefficient .rho..sub.tt =1-(.sigma..sub.p.sup.2 /(2.sigma..sub.t.sup.2)). If necessary, an SNR.sub.t =.rho..sub.tt.sup.2 /(1-.rho..sub.tt.sup.2) is obtained. The .rho..sub.tt and/or the SNR.sub.t is defined as a quality measure of a clock signal.
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