Semiconductor temperature detecting method and its circuit
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United States of America Patent
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May 11, 2004
Grant Date -
Feb 7, 2002
app pub date -
Jul 31, 2001
filing date -
Aug 4, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A semiconductor temperature detecting circuit use semiconductor temperature sensors each comprising bipolar transistors connected in a Darlington connection to provide a semiconductor temperature detecting circuit capable of automatically compensating for variations in fabrication of a reference voltage for comparing outputs of temperature sensors. The semiconductor temperature detecting circuit includes a first and a second semiconductor temperature sensor each having bipolar transistors connected in Darlington connection and respectively receiving different constant currents (I and nxI). Temperature detected is based on a corresponding relationship between a ratio of output voltages of the first and the second semiconductor temperature sensors and the temperature.
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