Optical path length tuning methods in etalons
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United States of America Patent
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Apr 13, 2004
Grant Date -
Feb 20, 2003
app pub date -
Aug 8, 2002
filing date -
Aug 9, 2001
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Abstract
Fine-tuning of the optical path length in etalon cavities is achieved by slight variations of the cavity's index of refraction. Such index of refraction variations are accomplished by varying the relative gas mixture in gas-gap etalons or UV-exposing doped glass layer(s) in solid etalons or gas-gap+glass etalons.
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