Method and apparatus for measuring nitrogen in a gas
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United States of America Patent
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Apr 6, 2004
Grant Date -
Oct 3, 2002
app pub date -
Mar 18, 2002
filing date -
Mar 29, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention provides a method and an apparatus for analyzing nitrogen in a gas, in which the concentration of nitrogen can be continuously measured with good sensitivity without wasting a sample gas. At least one wavelength for measuring a concentration of nitrogen according to the intensity of a light generated by discharge, is selected from a group consisting of 215.+-.2 nm, 226.+-.2 nm, 238.+-.2 nm, 242.+-.2 nm, 246.+-.1 nm, 256.+-.2 nm, 260.+-.2 nm, 266.+-.2 nm, 271.+-.1 nm, 276.+-.4 nm, 285.+-.2 nm, 294.+-.1 nm, and 300.+-.2 nm.
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