Calibration method
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United States of America Patent
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Apr 6, 2004
Grant Date -
Mar 21, 2002
app pub date -
Sep 6, 2001
filing date -
Sep 6, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In its most general terms the invention compensates for the effect of the mass offset in the prior art calibration method. This can be achieved either by correcting for the offset or assigning mass to the peaks in such a way that the offset is avoided. Accordingly in a first aspect there is provided a method of calibrating a reflectron time-of-flight mass spectrometer using a spectrum generated by fragment ions wherein the mass of the fragment ion is assigned using the mono-isotopic peak only. In other words a value corresponding to the mass of the fragment ion used for calibration is assigned using the fragment ion mono-isotopic peak only and said value is used to calibrate the spectrometer.
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