Cantilever for vertical scanning microscope and probe for vertical scan microscope
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United States of America Patent
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-
Mar 16, 2004
Grant Date -
Jan 16, 2003
app pub date -
Jul 26, 2002
filing date -
Nov 26, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A cantilever for a vertical scanning type microscope that obtains substance information of a surface of a specimen by a tip end of a nanotube probe needle fastened to the cantilever, in which the cantilever has a fixing region to which a base end portion of a nanotube serving as a probe needle is fastened, and a height direction of the fixing region is set to be substantially perpendicular to a mean surface of the specimen when the cantilever is disposed in a measuring state with respect to the mean surface of the specimen; and the base end portion of the nanotube is bonded in the height direction of the fixing region.
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