Apparatus for and method of measuring a jitter

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United States of America Patent

PATENT NO 6687629
SERIAL NO

09408280

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Abstract

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A clock waveform X.sub.C (t) is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a varying term .DELTA..phi.(t). A difference between the maximum value and the minimum value of the varying term .DELTA..phi.(t) is obtained as a peak-to-peak jitter, and a root-mean-square of the varying term .DELTA..phi.(t) is calculated to obtain an RMS jitter.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST CORPORATION1-6-2 MARUNOUCHI CHIYODA-KU TOKYO 1000005 ?1000005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Furukawa, Yasuo Tokyo, JP 65 1097
Ishida, Masahiro Tokyo, JP 375 4376
Soma, Mani 12043 11th Ave. NW., Seattle, WA 98177-4611 41 971
Watanabe, Toshifumi Tokyo, JP 70 575
Yamaguchi, Takahiro Tokyo, JP 464 4091

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