Procedure arrangement and sensor for testing of the H-F tightness of the junction between two adjacent parts
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United States of America Patent
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Feb 3, 2004
Grant Date -
Oct 10, 2002
app pub date -
Apr 4, 2002
filing date -
Apr 6, 2001
priority date (Note) -
Expired
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Abstract
Arrangement to test HF tightness of a junction between two adjacent parts including HF generator (4), HF line that guides the signal over junction (1), measuring device (10) as well as a signal analyzer. HF line includes two waveguides (5a, 5b) that have inner conductors (6a, 6b) connected all the way through by a connection conductor (9) and outer conductors (7a, 7b) interrupted and each connected with electrodes (8a, 8b). A capacitive coupling of the HF signal occurs on one side of the junction and a capacitive decoupling of the HF signal takes place on the other side. By comparing the measured transmission and/or reflection of the HF signal with a transmission or reflection characteristic for the junction, it can be determined if the junction is HF tight. This makes it possible to test HF shielded cases for HF tightness in a non-destructive manner and without interfering with the contents.
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