Preparation of thin lead samples for alpha particle emission test
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United States of America Patent
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Jan 6, 2004
Grant Date -
May 22, 2003
app pub date -
Nov 15, 2001
filing date -
Nov 15, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of preparing a lead sample to determine an amount of alpha particle emission. First, a thin slice is obtained from the lead source, such as by cutting the lead source using a microtome. The thin slice may be rolled to flatten any wrinkles caused by the cutting. The flattened slice is then heated to near the melting point of lead to drive the polonium atoms to the surface of the slice. The slice may be cooled down to ambient temperature in Nitrogen gas. Once so prepared, the thin slice can be tested for an amount of alpha particle emission.
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