Electron detection device
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United States of America Patent
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Dec 30, 2003
Grant Date -
Mar 27, 2003
app pub date -
Sep 18, 2002
filing date -
Sep 25, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electron detection device for use with an electron microscope defining a sample chamber. The device comprises a housing which in use is mounted to and opens into or forms part of a sample chamber of an electron microscope. A support structure is attached to the detection device housing and is in communication with the sample chamber in use. The support structure supports within it a member from which depends a phosphor scintillator, the member being movable between an extended position in which the phosphor scintillator is close enough to a sample to be struck by electrons and a retracted position. A control system controls movement of the member; and a detector monitors light emitted by the phosphor scintillator in response to electron impact.
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