External test auxiliary device to be used for testing semiconductor device
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United States of America Patent
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Nov 25, 2003
Grant Date -
Aug 29, 2002
app pub date -
Aug 13, 2001
filing date -
Feb 8, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A BOST (built-off self-test) board has a connector, a substrate for use with a BOST board, and an external self-test circuit. The external self-test circuit has an ADC (analog-to-digital converter)/DAC (digital-to-analog converter) measurement section and a DSP (digital signal processor). In accordance with a control signal input by way of a specific terminal provided in a connector, the ADC/DAC measurement section transmits a predetermined test signal to the specific terminal provided in the connector. Further, in response to the test signal, the ADC/DAC measurement section receives a response signal input to the specific terminal provided in the connector. The DSP analysis section analyzes the response signal, thereby determining whether or not the response signal is an appropriate signal. Further, the DSP analysis section transmits, to the specific terminal provided in the connector, a test result signal indicating whether or not the response signal is appropriate.
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