Coin inspection method and device
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 4, 2003
Grant Date -
N/A
app pub date -
Oct 4, 2000
filing date -
Oct 6, 1999
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A coin inspection method and device of inexpensive composition are provided, whereby the shape of the edge portions of a coin and the indentations patterns on the surface of a coin can be inspected with a high level of accuracy by means of a simple, single group of coils. Detecting coils generating a double-peak shaped magnetic field are formed by providing a first detecting coil and a second detecting coil respectively on two adjacent leg sections of a comb-shaped core, wherein a plurality of leg sections are disposed in approximately linear fashion at prescribed intervals, and the first detecting coil and the second detecting coil are excited in such a manner that the magnetic fluxes generated at the magnetic poles formed by the two leg sections repel with each other; a coin under inspection is caused to pass through the double-peak shaped magnetic field generated by the detecting coils; and the authenticity of the coin under inspection is identified on the basis of the changes in the impedance generated by the detecting coils during the passage of the coin under inspection.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully