System of fabricating plane parallel substrates with uniform optical paths
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United States of America Patent
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Oct 28, 2003
Grant Date -
Dec 20, 2001
app pub date -
Jun 1, 2001
filing date -
Jun 2, 2000
priority date (Note) -
Expired
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Abstract
Process and apparatus for automated production of optical devices comprising two plane parallel optical surfaces of a desired optical performance for transmitted light, by measuring and quantifying the spectral response of intensity versus wavelength across the working surface area of a starter optical device as compared to an acceptable computer model, as a three dimensional contour map of optical thickness based on the assumption of a constant index of refraction, then reducing the high spots by automated means such as polishing, and measuring the spectral response again.
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