Device for measurement of metal sheet thickness and clad layer thickness and method of use thereof
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United States of America Patent
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Oct 7, 2003
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N/A
app pub date -
Aug 10, 2000
filing date -
Aug 10, 1999
priority date (Note) -
Expired
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Abstract
A device for the measurement of the thickness of a first layer, including one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis, includes (a) an X-ray source for generating and directing a beam of polychromatic primary X-rays, the beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element; and (b) a detector module for detecting element specific fluorescent X-rays and determining an intensity thereof. In the method of using the device, the detector module for detection is placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. The device achieves an improvement in the efficiency of detection, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analyzed, for determining the thickness of a cladding.
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