Method for forming a Cu interconnect pattern

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United States of America Patent

PATENT NO 6607981
SERIAL NO

09656657

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Abstract

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A method for forming a Cu interconnect pattern on a ZnO film of a printed circuit board without using a metallic catalyst on the ZnO film includes the steps of replacing Zn in the ZnO film by Cu in an aqueous solution of copper sulfate to form a CuO film, reducing the CuO in the CuO film to Cu in an aqueous solution of hydrogenated boron potassium to form a metallic Cu film, and plating the metallic Cu film with a plating Cu film in a plating liquid. The absence of the metallic catalyst improves the insulation resistance of the Cu interconnect pattern in the printed circuit board.

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Patent Owner(s)

Patent OwnerAddress
OSAKA MUNICIPAL TECHNICAL RESEARCH INSTITUTE6-50 MORINOMIYA 1-CHOME JOTO-KU OSAKA-SHI OSAKA 5368553

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Izaki, Masanobu Nara, JP 4 23
Katayama, Junichi Osaka, JP 27 89
Nakamura, Hirofumi Toyama, JP 120 1209
Takahashi, Hisaya Toyama, JP 28 183

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