Apparatus for localized measurements of complex permittivity of a material
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United States of America Patent
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Jul 22, 2003
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N/A
app pub date -
Sep 20, 2000
filing date -
Sep 20, 2000
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Expired
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Abstract
An apparatus for localized measurements of complex permittivity of a material is provided. A probe (10) analyzes the complex permittivity of a sample (11), the probe (10) having a balanced two conductor transmission line (12) formed of conductive segments (13 and 14). A probing end (15) of the transmission line (12) is brought within close proximity of sample (11) and an opposite end (16) of the transmission line is connected to a terminating plate (17) to form a resonator structure (18) for measurement of the complex permittivity of sample (11).
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