Arrangement and method for measuring surface irregularities
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United States of America Patent
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Jun 10, 2003
Grant Date -
Jul 18, 2002
app pub date -
Oct 9, 2001
filing date -
Feb 9, 2000
priority date (Note) -
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Abstract
An arrangement and method for measuring surface irregularities of an object comprising at least one source of light arranged to illuminate the object from at least two different positions at a small angle of incidence towards the object, a camera arranged to measure the shadow formation generated by the illumination of the surface microstructure, and an evaluator for determining the surface microstructure from the generated shadow formation by means of signal processing of an input signal from the camera.
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