Sensor and method for measuring changes in environmental conditions
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United States of America Patent
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Jun 10, 2003
Issued Date -
N/A
app pub date -
May 31, 2000
filing date -
Jul 30, 1998
priority date (Note) -
Expired
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Abstract
A sensor has an interferometer which measures a change in an applied environmental condition relative to a reference environmental condition. The interferometer is operated under the applied environmental condition to generate an interference spectrum. Intensities of the interference spectrum are measured at first and second wavelengths, respectively. The first and second wavelengths correspond to first and second reference intensities that are separated from one another by an odd number of extrema in the interference spectrum when the interferometer is operated under the reference condition. Measurement of the change in the applied environmental condition is based on the measured intensities and the first and second reference intensities.
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