Measurement apparatus for measuring internal quality of object
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United States of America Patent
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May 13, 2003
Issued Date -
N/A
app pub date -
Jun 1, 2000
filing date -
May 15, 1998
priority date (Note) -
Expired
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Abstract
The present invention relates to an internal quality measuring apparatus for measuring an internal quality of an object, and the apparatus has a conveying device, a detecting device, a light projecting device, a light receiving device, an analyzing device and a pseudo-object member interposing device, and the analyzing device compares light received with a pseudo-object member, with reference data preliminarily stored, and correct a result of the analysis, based thereon.
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