Method and device for calibrating measurements of temperatures independent of emissivity
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United States of America Patent
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May 13, 2003
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app pub date -
Apr 19, 2001
filing date -
Jul 28, 1998
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Abstract
A method and apparatus for calibrating temperature measurements that are taken with a first radiation detector for measuring thermal radiation given off by a reference substrate are provided. The method includes the steps of heating the reference substrate, which carries at least one reference material having a known melting point temperature, to or over the melting point temperature and measuring the thermal radiation of the reference substrate during the heating step, during a cooling period that follows the heating, or during both the heating and the cooling periods. The method also includes the step of correlating a measurement plateau of the thermal radiation which occurs during the measuring step with the known melting point temperature.
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