Method and apparatus for distributed test pattern decompression
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United States of America Patent
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May 6, 2003
Grant Date -
N/A
app pub date -
Jul 2, 2001
filing date -
Jul 2, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method is described that decompresses at least a section of a first test pattern within a first decompression engine while simultaneously decompressing at least a section of a second test pattern within a second decompression engine. The first test pattern is to be applied to a first device under test (DUT) connection. The second test pattern is to be applied to a second DUT connection.
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