Integrated circuit analysis and design involving defective circuit element replacement on a netlist
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United States of America Patent
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Apr 8, 2003
Grant Date -
N/A
app pub date -
Dec 13, 1999
filing date -
Dec 13, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of operating on a net-list describing an integrated circuit design for use with an automated test pattern generator for testing an integrated circuit built using the design is described. The method includes replacing a defective portion of the design in test mode with a substitute circuit to reduce testing impact of the defective portion. The method includes identifying a first defective portion of the integrated circuit design in the net-list, determining conditions under which the first defective portion is likely to malfunction and replacing the first defective portion in the net-list with another first portion that provides unknown output signals representing an unknown state in response to conditions under which the first defective portion is likely to malfunction.
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