QCM sensor

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United States of America Patent

PATENT NO 6544478
SERIAL NO

09341465

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Abstract

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A QCM sensor including a sensor device, the sensor device having a crystal substrate, on both of front and rear surfaces of which a pair of electrodes are disposed so as to oppose with each other and the QCM sensor detecting and quantitatively analyzing components of a sample from either a variation in a fundamental resonant frequency or a variation in an impedance when a surface of one of the pair of electrodes is immersed into either a sample gas or a sample solution. The sensor device is arranged in a multi-channel structure such that four mutually opposing electrodes (11A through 14A, 12B through 14B) are disposed on both front and rear surfaces of the crystal substrate 10, each electrode being arranged to enable a fixation of a receptor which is different for each component of a sample to be detected and quantitatively analyzed, whereby the QCM sensor detects and quantitatively analyzes once the components of one sample different for different electrodes.

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Patent Owner(s)

Patent OwnerAddress
COPYER CO LTDNO 3-3 SHIMORENJAKU 6-CHOME MITAKA-SHI TOKYO 181

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Haba, Masanori Chiba, JP 18 85
Hatozaki, Osamu Tokyo, JP 7 147
Kitakizaki, Kaoru Saitama, JP 19 131
Noguchi, Takayuki Tokyo, JP 15 106
Oyama, Noboru 3-10-7, Kichijojihigashi-cho, Musashino-shi, Tokyo 180-0002, JP 31 2278
Tatsuma, Tetsu Tokyo, JP 4 24
Watanabe, Yoshihito Tokyo, JP 13 80

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