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Abstract

A semiconductor memory device has MIS transistors to constitute a memory cell array. Each of the MIS transistors has a silicon layer in a floating state. Furthermore, the MIS transistor has a second gate, a potential of which is fixed in order to control a potential of the silicon layer by a capacitive coupling, in addition to a first gate, which forms a channel between a source region and a drain region of the MIS transistor. The MIS transistor dynamically stores a first data state in which the silicon layer has a first potential set by impact ionization generated near a drain junction and a second data state in which the silicon layer has a second potential set by a forward current flowing through the drain junction.

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First Claim