Automated run test system having built-in high voltage switching matrix for interconnection to a safety compliance testing instrument
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United States of America Patent
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Mar 25, 2003
Grant Date -
Oct 10, 2002
app pub date -
Apr 10, 2001
filing date -
Apr 10, 2001
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Abstract
An electrical run test instrument having a connection to a device under test includes a line voltage input, a high voltage input, and a high voltage switching matrix that enables selective connections between the device under test and line voltage or high voltage inputs using the same test set-up. The high voltage input may be interconnected with a safety compliance test instrument, permitting both run tests and line tests to be performed in succession using the same basic connection to the device under test.
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