Semiconductor substrate and method of manufacturing the same

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United States of America Patent

PATENT NO 6534380
SERIAL NO

09116956

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Abstract

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Before a semiconductor substrate and a base substrate is directly bonded to one another, in a protective film removing step, a contamination protective film formed on the semiconductor substrate to protect it from contamination during an ion implanting step is removed. Consequently, even when flatness of the contamination protective film is degraded during the ion implanting step or even when contaminants remain in a segregated state in the vicinity of the surface of the contamination protective film, the state of the bonding between the semiconductor substrate and the base substrate after the bonding step can be made uniform over the entire area of the bonding. As a result, a high-quality semiconductor substrate can be manufactured at low cost.

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Patent Owner(s)

Patent OwnerAddress
DENSO CORPORATIONKARIYA-CITY AICHI-PREF 448-8661

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Izumi, Toshifumi Chiryu, JP 1 232
Matsui, Masaki Nagoya, JP 62 1452
Ohshima, Hisayoshi Obu, JP 21 1001
Onoda, Kunihiro Nagoya, JP 7 1055
Ooka, Tadao Aichi-gun, JP 1 232
Yamanaka, Akitoshi Hekinan, JP 14 399
Yamauchi, Shoichi Obu, JP 44 1442

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