Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object
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United States of America Patent
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Mar 11, 2003
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N/A
app pub date -
Oct 16, 2001
filing date -
Oct 16, 2001
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Abstract
The present invention relates to an automated inspection apparatus for detection of anomalies in a 3D translucent object, the apparatus having a scanhead assembly including an image processing unit and image capture device, a first and a second light source, and conveyor means, the improvement comprising a light block member positioned along a substantially common axis of the image capture device and a light source.
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