Automated calibration adjustment for film dosimetry
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Mar 4, 2003
Grant Date -
N/A
app pub date -
Jan 21, 2000
filing date -
Jan 21, 2000
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The present invention provides a method of correcting errors in film dosimetry measurements arising from variations in radiographic film processing and manufacturing. The method includes: (1) irradiating separate and distinct areas of one or more calibration films with different radiation dose levels to obtain a first calibration; (2) exposing a non-irradiated portion of at least one (and typically all) of the calibration films to light from an array of standardized light sources to obtain a first optical density step gradient; (3) exposing a non-irradiated portion of subsequent test films to light from the array of standardized light sources to obtain a second optical density step gradient; and (4) modifying the first calibration or optical density values of the test films based on differences between the first and second optical density step gradients. Since the characteristics of each of the standardized light sources vary little from one exposure to the next, any deviations in the optical density step gradient among different films results, presumably, from changes in film processing or differences in film chemistry.
First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
RADIOLOGICAL IMAGING TECHNOLOGY INC CORPORATION OF COLORADO | 637 A ELKTON DRIVE COLORADO SPRINGS CO 80907 |
International Classification(s)

- 2000 Application Filing Year
- G01T Class
- 166 Applications Filed
- 73 Patents Issued To-Date
- 43.98 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Ritt, Daniel M | Colorado Springs, CO | 16 | 191 |
# of filed Patents : 16 Total Citations : 191 |
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Patent Citation Ranking
- 13 Citation Count
- G01T Class
- 73.95 % this patent is cited more than
- 22 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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Sep 30, 2004 | FPAY | FEE PAYMENT | year of fee payment: 12 |
Sep 29, 2000 | FPAY | FEE PAYMENT | year of fee payment: 8 |
Dec 09, 1999 | FEPP | FEE PAYMENT PROCEDURE | free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
Jan 27, 1997 | FPAY | FEE PAYMENT | year of fee payment: 4 |
Jul 27, 1993 | I | Issuance | |
Jul 16, 1993 | STCF | INFORMATION ON STATUS: PATENT GRANT | free format text: PATENTED CASE |
Mar 12, 1991 | F | Filing | |
Mar 06, 1991 | AS | ASSIGNMENT | free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNORS:SOMA, TAKAO;USHIKOSHI, RYUSUKE;NOBORI, KAZUHIRO;REEL/FRAME:005636/0037 Owner name: NGK INSULATORS, LTD., 2-56, SUDA-CHO, MIZUHO-KU, N Effective Date: Mar 06, 1991 |
Mar 12, 1990 | PD | Priority Date |

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