Method and device for non-destructive inspection of objects by means of optical holographic interferometry
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United States of America Patent
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Feb 18, 2003
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N/A
app pub date -
Jun 13, 2000
filing date -
Oct 29, 1999
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Expired
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Abstract
This invention relates to a method and device for non-destructive inspection by means of holographic interferometry of details, machine units, mechanisms, and various materials, which eliminates the problem of relative displacement of the object with regard to the holographic equipment, especially due to vibratory motion of the object. This is achieved by transporting the reference and object beams between the investigated object, light source, and interferometer in flexible wave guidance cables and that the endpoints of the flexible wave guidance cables are securely attached in a fixed distance from the investigated object, recording medium of the interferometer and light source, respectively. This will also give the benefit of dividing the holographic interferometer into an object part and a registering part which forms the interferograms. Thus it becomes possible to perform measurements on objects in situ under any weather condition while the sensitive recording equipment of the holographic interferometer can be operated in a distant protected location.
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