Photosensitive polymer composition, method for forming relief patterns, and electronic parts

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United States of America Patent

PATENT NO 6514658
SERIAL NO

09821038

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Abstract

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A positive-type, heat-resistant photosensitive polymer composition comprising (a) a polyimide precursor or a polyimide which is soluble in an aqueous alkaline solution, (b) a compound capable of generating an acid when exposed to light, and (c) a compound having a phenolic hydroxyl group; a method of forming a relief pattern comprising a step of applying the composition onto a substrate and drying it thereon, a step of exposing it, a step of developing it, and a step of heating it; and an electronic part having as a surface-protecting film or an interlayer insulating film.

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Patent Owner(s)

Patent OwnerAddress
HITACHI CHEMICAL DUPONT MICROSYSTEMS LTDBUNKYO-KU TOKYO 112-0004

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nunomura, Masataka Hitachi, JP 12 60
Ohe, Masayuki Hitachi, JP 6 25

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