Generating and controlling analog and digital signals on a mixed signal test system
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United States of America Patent
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Jan 28, 2003
Grant Date -
N/A
app pub date -
Mar 26, 1999
filing date -
Mar 26, 1999
priority date (Note) -
Expired
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Abstract
An automated test system that has analog and digital resources for testing mixed signal ICs. A control pattern is provided that is used by the automated test system to simultaneously control both the digital resources and the analog resources. The control pattern is comprised of a sequentially executed two-dimensional array with columns corresponding to analog and digital resources. The automated test system uses the control pattern to control both the analog and digital resources.
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