Method of analyzing a specimen comprising a compound material by x-ray fluorescence analysis
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United States of America Patent
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Jan 28, 2003
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N/A
app pub date -
Aug 8, 2000
filing date -
Aug 10, 1999
priority date (Note) -
Expired
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Abstract
The invention relates to a method of analyzing a specimen comprising a compound material by X-ray fluorescence analysis wherein a beam of polychromatic primary X-rays is generated in an X-ray tube by conversion of electric current into X-rays, and said beam is directed at the specimen, and wherein the element specific fluorescent X-rays are selectively detected using means for detection and an intensity of said fluorescent X-rays is determined. After the electric current is applied to the X-ray tube and the intensity of element specific fluorescent X-rays is determined, a second intensity of the element specific fluorescent X-rays is determined while applying an electric current with a different value than the previous electric current, and at least the relative abundance of the chemical element present in the compound material is then determined using the values of both intensities. The thickness of the first layer can be determined simultaneously.
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