Multi-beam apparatus for measuring surface quality
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United States of America Patent
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Jan 21, 2003
Grant Date -
Nov 21, 2002
app pub date -
May 15, 2001
filing date -
May 15, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for measuring the visual characteristics of a surface of a workpiece includes two separate light sources. The first source provides one or more focused beams of light which strike the workpiece at a first angle and are reflected therefrom. The second source provides one or more unfocused beams of light which strike the workpiece at a second angle, different from the first angle, and are reflected therefrom. All of the reflected beams converge onto a single photo detector. The beams are time multiplexed so that the photo detector only reads one beam at a time. The output of the photo detector is processed to provide surface quality measurements of the workpiece such as gloss, distinctness of image and orange peel.
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